Scanning Probe Microscopy (SPM)

Development and production of Scanning Probe Microscopy (SPM)
Design, prototyping and development of advanced microscopy and spectroscopy
instrumentation, nano-technology-based instrumentation.
• SNOM (scanning near field optical microscope) resolutions of up to 10 nanometers.
• AFM (atomic force microscope) resolutions of up to 200 picometers, makes it possible to obtain images of DNA, cells, small molecules, polymer.
• STM (scanning tunnelling microscope) resolutions of up to 10 picometers, able to provide images of individual atoms.
HIGH END PRODUCTS: Scanning probe microscopes (SPM) are a new class of very high resolution instruments able to distinguish the arrangement of the individual atoms on the crystalline surfaces of the materials. These microscopes can also operate in gaseous or liquid environments and do not require preliminary treatment of the samples; they are therefore also suitable for biological material.

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